Hsing-Chung Liang: search on Z-Library

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1

Testing Transition Delay Faults in Modified Booth Multipliers

Hsing-Chung Liang, Pao-Hsin Huang, Yan-Fei Tang

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2008

Language:

english

File:

PDF, 350 KB

english, 2008

2

Analysis of using the tongue deviation angle as a warning sign of a stroke

Ching-Chuan Wei, Shu-Wen Huang, Sheng-Lin Hsu, Hsing-Chung Chen, Jong-Shin Chen, Hsinying Liang

Journal:

BioMedical Engineering OnLine

Year:

2012

Language:

english

File:

PDF, 484 KB

english, 2012

3

[IEEE 2014 International Symposium on Next-Generation Electronics (ISNE) - Kwei-Shan Tao-Yuan, Taiwan (2014.5.7-2014.5.10)] 2014 International Symposium on Next-Generation Electronics (ISNE) - Multi-function controller for low-power multiple scan test of transition delay faults

Liang, Hsing-Chung, Ho, Chang-Jung

Year:

2014

Language:

english

File:

PDF, 532 KB

english, 2014

4

[IEEE 2012 Sixth International Conference on Innovative Mobile and Internet Services in Ubiquitous Computing (IMIS) - Palermo, Italy (2012.07.4-2012.07.6)] 2012 Sixth International Conference on Innovative Mobile and Internet Services in Ubiquitous Computing - Identifying Restricted-Faults in Multiprocessor Meshes under the PMC Diagnostic Model

Kung, Tzu-Liang, Lin, Cheng-Kuan, Tan, Jimmy J.M., Chen, Hon-Chan, Chen, Hsing-Chung

Year:

2012

Language:

english

File:

PDF, 190 KB

english, 2012

5

[IEEE Comput. Soc. Press Fifth Asian Test Symposium (ATS'96) - Hsinchu, Taiwan (20-22 Nov. 1996)] Proceedings of the Fifth Asian Test Symposium (ATS'96) - Invalid state identification for sequential circuit test generation

Hsing-Chung Liang,, Chung Len Lee,, Chen, J.E.

Year:

1996

Language:

english

File:

PDF, 539 KB

english, 1996

6

Identify unrepairability to speed-up spare allocation for repairing memories

Hsing-Chung Liang, Wen-Chin Ho, Ming-Chieh Cheng

Journal:

IEEE Transactions on Reliability

Year:

2005

Language:

english

File:

PDF, 318 KB

english, 2005

7

[IEEE Comput. Soc. Press IEEE 3rd Asian Test Symposium (ATS) - Nara, Japan (15-17 Nov. 1994)] Proceedings of IEEE 3rd Asian Test Symposium (ATS) - A sequential redundant fault identification scheme and its application to test generation

Hsing-Chung Liang,, Chung Len Lee,, Chen, J.E.

Year:

1994

Language:

english

File:

PDF, 519 KB

english, 1994

8

Identifying untestable faults in sequential circuits

Hsing-Chung Liang,, Chung Len Lee,, Chen, J.E.

Journal:

IEEE Design & Test of Computers

Year:

1995

Language:

english

File:

PDF, 852 KB

english, 1995

9

A secure group-based mobile chat protocol

Chen, Hsing-Chung, Mao, Chuan-Hsien, Lin, Yen-Tsung, Kung, Tzu-Liang, Weng, Chien-Erh

Journal:

Journal of Ambient Intelligence and Humanized Computing

Year:

2016

Language:

english

File:

PDF, 807 KB

english, 2016

10

IMPROVED REPRESENTATIVES FOR JUDGING UNREPAIRABILITY AND DECIDING ECONOMIC REPAIR SOLUTIONS OF MEMORIES

LIANG, HSING-CHUNG

Journal:

Journal of Circuits System and Computers

Year:

2009

Language:

english

File:

PDF, 308 KB

english, 2009

11

[IEEE 2006 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'06) - Taipei, Taiwan (02-04 Aug. 2006)] 2006 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'06) - Improved Representatives for Unrepairability Judging and Economic Repair Solutions of Memories

Hsing-Chung Liang,, Le-Quen Tzeng,

Year:

2006

Language:

english

File:

PDF, 221 KB

english, 2006

12

[IEEE 1994 Power Electronics Specialist Conference - PESC'94 - Taipei, Taiwan (20-25 June 1994)] Proceedings of 1994 Power Electronics Specialist Conference - PESC'94 - DSP-based digital control of a PWM inverter for sine wave tracking by optimal state feedback technique

Shih-Liang Jung,, Lien-Hsun Ho,, Hsing-Chung Yeh,, Ying-Yu Tzou,

Year:

1994

Language:

english

File:

PDF, 457 KB

english, 1994

13

[IEEE The 2004 IEEE Asia-Pacific Conference on Circuits and Systems, 2004. - Tainan, Taiwan (Dec. 6-9, 2004)] The 2004 IEEE Asia-Pacific Conference on Circuits and Systems, 2004. Proceedings. - Bus-oriented DFT design for embedded cores

Chih-Yi Lin,, Hsing-Chung Liang,

Year:

2004

Language:

english

File:

PDF, 223 KB

english, 2004

14

[IEEE TENCON 2007 - 2007 IEEE Region 10 Conference - Taipei, Taiwan (2007.10.30-2007.11.2)] TENCON 2007 - 2007 IEEE Region 10 Conference - Testing transition delay faults in modified Booth multipliers by using C-testable and SIC patterns

Hsing-Chung Liang,, Pao-Hsin Huang,

Year:

2007

Language:

english

File:

PDF, 252 KB

english, 2007

15

Identifying invalid states for sequential circuit test generation

Hsing-Chung Liang, Chung Len Lee, Chen, J.E.

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

1997

Language:

english

File:

PDF, 224 KB

english, 1997

16

[IEEE Comput. Soc 16th IEEE VLSI Test Symposium - Monterey, CA, USA (26-30 April 1998)] Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231) - Partial reset and scan for flip-flops based on states requirement for test generation

Hsing-Chung Liang,, Chung Len Lee,, Chen, J.E.

Year:

1998

Language:

english

File:

PDF, 30 KB

english, 1998

17

A localized fault detection algorithm for mobility management in the strongly t-diagnosable wireless ad hoc network under the comparison model

Kung, Tzu-Liang, Teng, Yuan-Hsiang, Lin, Cheng-Kuan, Chen, Hsing-Chung

Journal:

EURASIP Journal on Wireless Communications and Networking

Year:

2016

Language:

english

File:

PDF, 1.48 MB

english, 2016

18

[IEEE 2012 Sixth International Conference on Innovative Mobile and Internet Services in Ubiquitous Computing (IMIS) - Palermo, Italy (2012.07.4-2012.07.6)] 2012 Sixth International Conference on Innovative Mobile and Internet Services in Ubiquitous Computing - Three-Party Authenticated Quantum Key Distribution Protocol with Time Constraint

Chen, Hsing-Chung, Lin, Syuan-Zong, Kung, Tzu-Liang

Year:

2012

Language:

english

File:

PDF, 541 KB

english, 2012

19

Topological dynamics of comparison-based fault identification in ad hoc networks

Kung, Tzu-Liang, Chen, Hsing-Chung

Journal:

Pervasive and Mobile Computing

Year:

2017

Language:

english

File:

PDF, 1.01 MB

english, 2017

20

[IEEE Comput. Soc Eighth Asian Test Symposium - Shanghai, China (16-18 Nov. 1999)] Proceedings Eighth Asian Test Symposium (ATS'99) - An effective methodology for mixed scan and reset design based on test generation and structure of sequential circuits

Hsing-Chung Liang,, Chung Len Lee,

Year:

1999

Language:

english

File:

PDF, 111 KB

english, 1999

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